Measurement technology

For optical and topographical characterization of surfaces, we use optical microscopy, high-resolution scanning electron and atomic force microscopy optical and mechanical profilometers.

Measurement technology

Structure sizes and geometries can be measured with high precision by the instruments we use for coating masters, shims, sleeves, films and components.

An automated microscopy measuring station allows scanning of structure surfaces and characterization of structure features and defects. An in-line inspection system in our UV imprint roll-to-roll production lines measures the layer thickness and detects defects to check and document production quality.

 

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characterization

function

of surface
characterization

optical

properties
characterization

topographical

properties